Microelectronics Reliability
Last updated ISSN 0026-2714
Microelectronics Reliability is published by Elsevier BV in engineering. It is a subscription journal. The article processing charge is $2,280.
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What it publishes
Recent work in Microelectronics Reliability concentrates on these topics, taken from its published record rather than from its own description:
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Electronic Packaging and Soldering Technologies
- Reliability and Maintenance Optimization
- 3D IC and TSV technologies
- Silicon Carbide Semiconductor Technologies
- VLSI and Analog Circuit Testing
- Silicon and Solar Cell Technologies
- Electrostatic Discharge in Electronics
Key facts
| Publisher | Elsevier BV |
|---|---|
| ISSN | 0026-2714, 1872-941X |
| Subject area | Engineering |
| Access | Subscription |
| Article processing charge | $2,280 |
| Indexed in | Scopus |
| Articles published | 31,091 |
| Publishing since | 1962 |
| Journal website | www.journals.elsevier.com/microelectronics-reliabili |
Facts come from OpenAlex, DOAJ and Wikidata and may lag the journal’s own pages. Check the publisher’s site before submitting. Indexing shown here is what is recorded, not a complete picture — about a third of journals have no indexing recorded anywhere we can read, so “not recorded” does not mean a journal is absent from Scopus or Web of Science.
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