Journal of Micro/Nanopatterning Materials and Metrology
Last updated ISSN 2708-8340
Journal of Micro/Nanopatterning Materials and Metrology is an academic journal in engineering. It is a subscription journal. Its article processing charge is not published.
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What it publishes
Recent work in Journal of Micro/Nanopatterning Materials and Metrology concentrates on these topics, taken from its published record rather than from its own description:
- Advancements in Photolithography Techniques
- Electron and X-Ray Spectroscopy Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Nanofabrication and Lithography Techniques
- Optical Coatings and Gratings
- Industrial Vision Systems and Defect Detection
- Advanced X-ray Imaging Techniques
- Surface Roughness and Optical Measurements
- Semiconductor materials and devices
- Advanced Surface Polishing Techniques
Key facts
| Publisher | Not recorded |
|---|---|
| ISSN | 2708-8340 |
| Subject area | Engineering |
| Access | Subscription |
| Article processing charge | Not published |
| Indexed in | Not recorded |
| Articles published | 440 |
| Publishing since | 2010 |
Facts come from OpenAlex, DOAJ and Wikidata and may lag the journal’s own pages. Check the publisher’s site before submitting. Indexing shown here is what is recorded, not a complete picture — about a third of journals have no indexing recorded anywhere we can read, so “not recorded” does not mean a journal is absent from Scopus or Web of Science.
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