Journal of Electronic Testing
Last updated ISSN 0923-8174
Journal of Electronic Testing is published by Springer Science+Business Media in computer science. It is a subscription journal. The article processing charge is $3,290.
Is your paper a fit?
The surest way to know is to compare your own abstract against what this journal has actually been publishing, rather than against its aims-and-scope page. Paste your abstract and Journal Hunt will tell you how close Journal of Electronic Testing is — and show you journals like it.
What it publishes
Recent work in Journal of Electronic Testing concentrates on these topics, taken from its published record rather than from its own description:
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Physical Unclonable Functions (PUFs) and Hardware Security
- VLSI and FPGA Design Techniques
- Engineering and Test Systems
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Software Testing and Debugging Techniques
Key facts
| Publisher | Springer Science+Business Media |
|---|---|
| ISSN | 0923-8174, 1573-0727 |
| Subject area | Computer Science |
| Access | Subscription |
| Article processing charge | $3,290 |
| Indexed in | Web of Science — Science Citation Index Expanded · Scopus |
| Articles published | 2,201 |
| Publishing since | 1981 |
| Journal website | link.springer.com/journal/10836 |
Facts come from OpenAlex, DOAJ and Wikidata and may lag the journal’s own pages. Check the publisher’s site before submitting. Indexing shown here is what is recorded, not a complete picture — about a third of journals have no indexing recorded anywhere we can read, so “not recorded” does not mean a journal is absent from Scopus or Web of Science.
Journals like Journal of Electronic Testing
Other established journals in computer science, if this one is not the right home for your paper: