IEEE Transactions on Device and Materials Reliability
Last updated ISSN 1530-4388
IEEE Transactions on Device and Materials Reliability is published by Institute of Electrical and Electronics Engineers in engineering. It is a subscription journal. The article processing charge is $2,645.
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What it publishes
Recent work in IEEE Transactions on Device and Materials Reliability concentrates on these topics, taken from its published record rather than from its own description:
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic Packaging and Soldering Technologies
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
- Radiation Effects in Electronics
- VLSI and Analog Circuit Testing
- 3D IC and TSV technologies
Key facts
| Publisher | Institute of Electrical and Electronics Engineers |
|---|---|
| ISSN | 1530-4388, 1558-2574 |
| Subject area | Engineering |
| Access | Subscription |
| Article processing charge | $2,645 |
| Indexed in | Scopus |
| Articles published | 2,811 |
| Publishing since | 2001 |
| Journal website | ieeexplore.ieee.org/servlet/opac?punumber=7298 |
Facts come from OpenAlex, DOAJ and Wikidata and may lag the journal’s own pages. Check the publisher’s site before submitting. Indexing shown here is what is recorded, not a complete picture — about a third of journals have no indexing recorded anywhere we can read, so “not recorded” does not mean a journal is absent from Scopus or Web of Science.
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