IEEE Design and Test
Last updated ISSN 2168-2356
IEEE Design and Test is published by Institute of Electrical and Electronics Engineers in computer science. It is a subscription journal. Its article processing charge is not published.
Is your paper a fit?
The surest way to know is to compare your own abstract against what this journal has actually been publishing, rather than against its aims-and-scope page. Paste your abstract and Journal Hunt will tell you how close IEEE Design and Test is — and show you journals like it.
What it publishes
Recent work in IEEE Design and Test concentrates on these topics, taken from its published record rather than from its own description:
- VLSI and Analog Circuit Testing
- Diverse Scientific and Economic Studies
- Human auditory perception and evaluation
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Physical Unclonable Functions (PUFs) and Hardware Security
- Advanced Memory and Neural Computing
- Educational Robotics and Engineering
- Parallel Computing and Optimization Techniques
- Embedded Systems Design Techniques
Key facts
| Publisher | Institute of Electrical and Electronics Engineers |
|---|---|
| ISSN | 2168-2356, 2168-2364 |
| Subject area | Computer Science |
| Access | Subscription |
| Article processing charge | Not published |
| Indexed in | Web of Science — Science Citation Index Expanded · Scopus |
| Articles published | 1,800 |
| Publishing since | 2009 |
Facts come from OpenAlex, DOAJ and Wikidata and may lag the journal’s own pages. Check the publisher’s site before submitting. Indexing shown here is what is recorded, not a complete picture — about a third of journals have no indexing recorded anywhere we can read, so “not recorded” does not mean a journal is absent from Scopus or Web of Science.
Journals like IEEE Design and Test
Other established journals in computer science, if this one is not the right home for your paper: